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Public service evidence

Characterization Facility (CharFac)

Characterization Facility (CharFac) at University of Minnesota provides shared-facility access for x-ray and synchrotron characterization, electron microscopy, surface and thin-film characterization, and optical microscopy and spectroscopy. Registration, training, project review, fees, and current instrument availability may apply.

External services publicly offered

7 capabilities 12 equipment records Reviewed 2026-08-29

Publicly described capabilities

Advanced characterization

X-ray and synchrotron characterization

Advanced characterization

Electron microscopy

Advanced characterization

Surface and thin-film characterization

Advanced characterization

Optical microscopy and spectroscopy

Analytical testing

Elemental and trace analysis

Analytical testing

Analytical chemistry

Materials testing

Materials characterization

Technical inventory

Techniques and equipment

4 equipment types
  • Laboratory equipment

    Bruker/Anasys NanoIR3

  • Microscopy & imaging

    Horiba LabRAM confocal Raman microscope

  • Laboratory equipment

    Keyence VK-X3050 optical profilometer

  • Laboratory equipment

    Omicron low-temperature STM

  • Surface analysis

    PHI 5000 VersaProbe III XPS/UPS spectrometer

  • X-ray & neutron

    Rigaku SmartLab SE X-ray diffractometer

  • X-ray & neutron

    Rigaku SmartLab XE X-ray diffractometer

  • Laboratory equipment

    Xenocs Ganesha SAXS/WAXS system

  • Microscopy & imaging

    Moos Tower provides a 120 kV cryo/high-contrast TEM; Tate Hall contains the electron microprobe laboratory.

  • Microscopy & imaging

    Nils Hasselmo Hall provides three cryo-capable electron microscopes, cryo/bio specimen preparation and three advanced environmental/IR scanning-probe systems.

  • Surface analysis

    Shepherd Labs also provides XPS, Auger, FTIR, Raman, nanomechanical probes, optical microscopy, ellipsometry, microtensiometry and light-ion beam analysis.

  • Microscopy & imaging

    Shepherd Labs contains five TEM/SEM instruments plus FIB, three ambient scanning-probe microscopes and seven wide-/small-angle X-ray scattering systems.

Registry scope evidence

  • Commercial access: Industrial clients commonly submit samples for analyst-run contract work.
  • Academic access: External academics can use analytical services or train for hands-on access without a formal proposal review.
  • Scope: Methods include microscopy, chemical and elemental imaging/spectroscopy, scattering, depth profiling, nanomechanics and thin-film metrology.
  • Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.

Evidence used for this listing

Vicena compiles these public listings from cited laboratory sources. A listing does not imply a partnership, current availability, pricing, or acceptance of a project. This profile is not an endorsement, availability check, quote, or representation of a commercial relationship.