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Huson Imaging & Characterization Laboratory (HICL)

Huson Imaging & Characterization Laboratory (HICL) at University of Louisville provides shared-facility access for electron microscopy, surface and thin-film characterization, elemental and trace analysis, and analytical chemistry. Registration, training, project review, fees, and current instrument availability may apply.

External services publicly offered

4 capabilities 4 equipment records Reviewed 2026-08-29

Publicly described capabilities

Advanced characterization

Electron microscopy

Advanced characterization

Surface and thin-film characterization

Analytical testing

Elemental and trace analysis

Analytical testing

Analytical chemistry

Explore the equipment

Instrument models

2 illustrated models

CAD illustrations show the instrument model. Confirm the installed configuration and current availability with the lab.

Technical inventory

Techniques and equipment

3 equipment types

  • Microscopy & imaging

    electron and optical microscopy resources (models not established in reviewed page)

  • Laboratory equipment

    materials characterization resources (models not established in reviewed page)

  • Microscopy & imaging

    HICL equipment includes a Thermo Fisher Apreo C LoVac FE-SEM with variable pressure, BSE, STEM and EDS; a Hitachi HT7700 TEM; Asylum MFP-3D-Bio and MFP-3D conductive AFMs; and QFI mid-wave thermal imaging.

  • Micro/nanofabrication

    Sample preparation includes Ted Pella Au/Au-Pd sputter coating and critical-point drying; contact-angle/goniometry is also listed for the imaging environment.

Registry scope evidence

  • ◇Services: SEM with EDS, STEM and BSD; sputter coating; critical-point drying; AFM; thermal microscopy; goniometry.
  • ◇External onboarding: Non-affiliated users can access after agreement, insurance and process review.
  • ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.

Evidence used for this listing

Facility-owned shared-access information Reviewed 2026-08-26Facility-owned shared-access information Reviewed 2026-08-26Facility-owned shared-access information Reviewed 2026-08-26Facility-owned shared-access information Reviewed 2026-08-26Huson Imaging & Characterization Laboratory (HICL) published instrument information Reviewed 2026-08-26Huson Imaging & Characterization Laboratory (HICL) official instrument evidence Reviewed 2026-08-29Huson Imaging & Characterization Laboratory (HICL) official instrument evidence Reviewed 2026-08-29

Vicena compiles these public listings from cited laboratory sources. A listing does not imply a partnership, current availability, pricing, or acceptance of a project. This profile is not an endorsement, availability check, quote, or representation of a commercial relationship.