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Public service evidence

Stanford Microchemical Analysis Facility

Stanford Microchemical Analysis Facility at Stanford University provides shared-facility access for surface and thin-film characterization, mass spectrometry, elemental and trace analysis, and analytical chemistry. Registration, training, project review, fees, and current instrument availability may apply.

External services publicly offered

4 capabilities 6 equipment records Reviewed 2026-08-29

Publicly described capabilities

Advanced characterization

Surface and thin-film characterization

Analytical testing

Mass spectrometry

Analytical testing

Elemental and trace analysis

Analytical testing

Analytical chemistry

Explore the equipment

Instrument models

2 illustrated models

CAD illustrations show the instrument model. Confirm the installed configuration and current availability with the lab.

CAD illustration of JEOL JXA-8230 Model illustration

Imaging / scanning system

JEOL JXA-8230

Equipment evidence

JEOL JXA-8230 SuperProbe electron microprobe provides five wavelength-dispersive X-ray spectrometers, EDS, electron imaging and xCLENT III hyperspectral cathodoluminescence.

Source 1 ↗Source 2 ↗Source 3 ↗Source 4 ↗Source 5 ↗
CAD illustration of JEOL JSM-IT500HR Model illustration

Scanning electron microscope

JEOL JSM-IT500HR

Equipment evidence

JEOL JSM-IT500HR environmental field-emission SEM includes SE/BSE detectors, Oxford Instruments EDS with Aztec software and a Centaurus monochromatic CL detector.

Source 1 ↗Source 2 ↗Source 3 ↗Source 4 ↗Source 5 ↗

Technical inventory

Techniques and equipment

5 equipment types

  • Analytical instrument

    elemental analysis instrument

  • Mass spectrometry

    mass spectrometer

  • Laboratory equipment

    spectrometer

  • Surface analysis

    surface analysis instrument

  • Microscopy & imaging

    JEOL JSM-IT500HR environmental field-emission SEM includes SE/BSE detectors, Oxford Instruments EDS with Aztec software and a Centaurus monochromatic CL detector.

  • Microscopy & imaging

    JEOL JXA-8230 SuperProbe electron microprobe provides five wavelength-dispersive X-ray spectrometers, EDS, electron imaging and xCLENT III hyperspectral cathodoluminescence.

Registry scope evidence

  • ◇Facility: Official Stanford MAF site presents shared microchemical analytical capabilities and resources..
  • ◇External access: nano@stanford provides a defined external-user pathway for academic, national laboratory, nonprofit and industry users..
  • ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.

Evidence used for this listing

Facility-owned shared-access information Reviewed 2026-08-26Facility-owned shared-access information Reviewed 2026-08-26Facility-owned shared-access information Reviewed 2026-08-26Stanford Microchemical Analysis Facility official instrument evidence Reviewed 2026-08-29Stanford Microchemical Analysis Facility official instrument evidence Reviewed 2026-08-29

Vicena compiles these public listings from cited laboratory sources. A listing does not imply a partnership, current availability, pricing, or acceptance of a project. This profile is not an endorsement, availability check, quote, or representation of a commercial relationship.