有公开服务证据
Advanced Photon Source (APS)
Advanced Photon Source (APS) at Argonne National Laboratory supports x-ray and synchrotron characterization. Access is proposal- or agreement-based and remains subject to feasibility, review, safety, scheduling, and allocation.
已确认承接外部委托
1 项服务能力 4 条设备记录 核查于 2026年8月29日
公开描述的能力
Advanced characterization
X-ray and synchrotron characterization
技术清单
技术与设备
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X 射线与中子
APS beamline portfolio
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X 射线与中子
powder and single-crystal diffraction stations
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实验室设备
scattering, tomography and imaging stations
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显微与成像
APS Upgrade feature beamlines include PtychoProbe, targeting structural/chemical X-ray microscopy with a 5 nm focus goal, and ATOMIC for multiscale 3D structural information.
登记范围证据
- ◇Access model: competitive General User Proposal; rapid, partner, CAT and proprietary routes documented.
- ◇Method: mail-in powder diffraction and pair-distribution-function rapid-access routes documented.
- ◇Availability note: beamline status varies during post-upgrade commissioning; current directory must be checked.
- ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.
本条目依据的证据
DOE and facility-owned user information 核查于 2026年8月26日DOE and facility-owned user information 核查于 2026年8月26日DOE and facility-owned user information 核查于 2026年8月26日Advanced Photon Source (APS) published instrument information 核查于 2026年8月26日Advanced Photon Source (APS) official instrument evidence 核查于 2026年8月29日
这些公开条目由 Vicena 根据所引用的实验室来源整理。被收录不代表存在合作关系，也不代表目前可承接、已有报价或已接受项目。本主页不构成推荐、可用性确认或报价，也不代表存在商业合作关系。