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有公开服务证据

Center for Nanoscale Materials (CNM)

Center for Nanoscale Materials (CNM) at Argonne National Laboratory supports x-ray and synchrotron characterization, electron microscopy, nanofabrication and microfabrication, and materials synthesis. Access is proposal- or agreement-based and remains subject to feasibility, review, safety, scheduling, and allocation.

已确认承接外部委托

4 项服务能力 8 条设备记录 核查于 2026年8月29日

公开描述的能力

Advanced characterization

X-ray and synchrotron characterization

Advanced characterization

Electron microscopy

Fabrication

Nanofabrication and microfabrication

Synthesis

Materials synthesis

了解设备

仪器型号

2 个型号示意图

CAD 示意图展示的是仪器型号。实际安装配置和当前可用性需向实验室确认。

技术清单

技术与设备

3 类设备

  • 微纳加工

    lithography, deposition and etch tools

  • 显微与成像

    nanoscale electron imaging and spectroscopy

  • 显微与成像

    synchrotron X-ray microscopy platform

  • X 射线与中子

    Hard X-ray Nanoprobe supports chemical/structural nanoimaging and scanning nanodiffraction in partnership with the Advanced Photon Source.

  • 显微与成像

    JEOL IT800HL SEM with secondary/backscatter detectors, EDS, STEM detection, low-vacuum mode and EBSD.

  • 显微与成像

    JEOL JEM-2100F field-emission TEM with 0.23 nm point and 0.1 nm line resolution, selected-area diffraction and analytical imaging.

  • 显微与成像

    Quantum Emitter Electron Nanomaterial Microscope (QuEEN-M) is available through the CNM user program for nanoscale cathodoluminescence imaging and ultrafast studies.

  • 显微与成像

    Ultrafast electron microscopy platform combines a tunable high-repetition-rate femtosecond laser with a pulsed, energy-filtered TEM.

登记范围证据

  • ◇Service scope: design, synthesis, characterization, theory and modeling for nanoscale systems.
  • ◇Access model: academic, industrial and international users; no-cost nonproprietary and cost-recovery proprietary access.
  • ◇Proposal term: approved projects may receive access for up to 18 months.
  • ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.

本条目依据的证据

DOE and facility-owned user information 核查于 2026年8月26日DOE and facility-owned user information 核查于 2026年8月26日DOE and facility-owned user information 核查于 2026年8月26日Center for Nanoscale Materials (CNM) published instrument information 核查于 2026年8月26日Center for Nanoscale Materials (CNM) official instrument evidence 核查于 2026年8月29日Center for Nanoscale Materials (CNM) official instrument evidence 核查于 2026年8月29日Center for Nanoscale Materials (CNM) official instrument evidence 核查于 2026年8月29日Center for Nanoscale Materials (CNM) official instrument evidence 核查于 2026年8月29日

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