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有公开服务证据

Center for Nanoscale Systems (CNS)

Center for Nanoscale Systems (CNS) at Harvard University provides shared-facility access for x-ray and synchrotron characterization, electron microscopy, nanofabrication and microfabrication, and optical microscopy and spectroscopy. Registration, training, project review, fees, and current instrument availability may apply.

公开提供对外服务

5 项服务能力 8 条设备记录 核查于 2026年8月29日

公开描述的能力

Advanced characterization

X-ray and synchrotron characterization

Advanced characterization

Electron microscopy

Fabrication

Nanofabrication and microfabrication

Advanced characterization

Optical microscopy and spectroscopy

Materials testing

Materials characterization

技术清单

技术与设备

4 类设备
  • 表面分析

    X-ray photoelectron spectroscopy instrumentation

  • 实验室设备

    atom probe tomography instrumentation

  • 显微与成像

    atomic force microscopy instrumentation

  • 显微与成像

    dual-beam FIB-SEM systems (two; model not stated on overview)

  • 显微与成像

    high-resolution scanning electron microscopes (three; model not stated on overview)

  • 显微与成像

    high-resolution transmission electron microscopes (four HRTEM systems; model not stated on overview)

  • 光谱

    Horiba LabRAM Evolution Raman system has 532 and 633 nm excitation, 800 mm spectrometer, 600/1800 gratings, Synapse CCD and confocal mapping.

  • 显微与成像

    JEOL 2100 is the standard self-use TEM after online, in-lab and one-on-one certification; advanced TEMs require additional training.

登记范围证据

  • ◇Facility scope: Two-site shared-use facility with Cambridge nanofabrication and imaging/analysis plus Allston imaging/analysis and soft-lithography resources.
  • ◇External access: Serves Harvard and the larger community of external academic and industry researchers.
  • ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.

本条目依据的证据

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