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有公开服务证据

Characterization Facility (CharFac)

Characterization Facility (CharFac) at University of Minnesota provides shared-facility access for x-ray and synchrotron characterization, electron microscopy, surface and thin-film characterization, and optical microscopy and spectroscopy. Registration, training, project review, fees, and current instrument availability may apply.

公开提供对外服务

7 项服务能力 12 条设备记录 核查于 2026年8月29日

公开描述的能力

Advanced characterization

X-ray and synchrotron characterization

Advanced characterization

Electron microscopy

Advanced characterization

Surface and thin-film characterization

Advanced characterization

Optical microscopy and spectroscopy

Analytical testing

Elemental and trace analysis

Analytical testing

Analytical chemistry

Materials testing

Materials characterization

技术清单

技术与设备

4 类设备
  • 实验室设备

    Bruker/Anasys NanoIR3

  • 显微与成像

    Horiba LabRAM confocal Raman microscope

  • 实验室设备

    Keyence VK-X3050 optical profilometer

  • 实验室设备

    Omicron low-temperature STM

  • 表面分析

    PHI 5000 VersaProbe III XPS/UPS spectrometer

  • X 射线与中子

    Rigaku SmartLab SE X-ray diffractometer

  • X 射线与中子

    Rigaku SmartLab XE X-ray diffractometer

  • 实验室设备

    Xenocs Ganesha SAXS/WAXS system

  • 显微与成像

    Moos Tower provides a 120 kV cryo/high-contrast TEM; Tate Hall contains the electron microprobe laboratory.

  • 显微与成像

    Nils Hasselmo Hall provides three cryo-capable electron microscopes, cryo/bio specimen preparation and three advanced environmental/IR scanning-probe systems.

  • 表面分析

    Shepherd Labs also provides XPS, Auger, FTIR, Raman, nanomechanical probes, optical microscopy, ellipsometry, microtensiometry and light-ion beam analysis.

  • 显微与成像

    Shepherd Labs contains five TEM/SEM instruments plus FIB, three ambient scanning-probe microscopes and seven wide-/small-angle X-ray scattering systems.

登记范围证据

  • ◇Commercial access: Industrial clients commonly submit samples for analyst-run contract work.
  • ◇Academic access: External academics can use analytical services or train for hands-on access without a formal proposal review.
  • ◇Scope: Methods include microscopy, chemical and elemental imaging/spectroscopy, scattering, depth profiling, nanomechanics and thin-film metrology.
  • ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.

本条目依据的证据

这些公开条目由 Vicena 根据所引用的实验室来源整理。被收录不代表存在合作关系,也不代表目前可承接、已有报价或已接受项目。本主页不构成推荐、可用性确认或报价,也不代表存在商业合作关系。