有公开服务证据
Characterization Facility (CharFac)
Characterization Facility (CharFac) at University of Minnesota provides shared-facility access for x-ray and synchrotron characterization, electron microscopy, surface and thin-film characterization, and optical microscopy and spectroscopy. Registration, training, project review, fees, and current instrument availability may apply.
公开提供对外服务
公开描述的能力
Advanced characterization
X-ray and synchrotron characterization
Advanced characterization
Electron microscopy
Advanced characterization
Surface and thin-film characterization
Advanced characterization
Optical microscopy and spectroscopy
Analytical testing
Elemental and trace analysis
Analytical testing
Analytical chemistry
Materials testing
Materials characterization
技术清单
技术与设备
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实验室设备
Bruker/Anasys NanoIR3
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显微与成像
Horiba LabRAM confocal Raman microscope
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实验室设备
Keyence VK-X3050 optical profilometer
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实验室设备
Omicron low-temperature STM
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表面分析
PHI 5000 VersaProbe III XPS/UPS spectrometer
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X 射线与中子
Rigaku SmartLab SE X-ray diffractometer
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X 射线与中子
Rigaku SmartLab XE X-ray diffractometer
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实验室设备
Xenocs Ganesha SAXS/WAXS system
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显微与成像
Moos Tower provides a 120 kV cryo/high-contrast TEM; Tate Hall contains the electron microprobe laboratory.
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显微与成像
Nils Hasselmo Hall provides three cryo-capable electron microscopes, cryo/bio specimen preparation and three advanced environmental/IR scanning-probe systems.
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表面分析
Shepherd Labs also provides XPS, Auger, FTIR, Raman, nanomechanical probes, optical microscopy, ellipsometry, microtensiometry and light-ion beam analysis.
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显微与成像
Shepherd Labs contains five TEM/SEM instruments plus FIB, three ambient scanning-probe microscopes and seven wide-/small-angle X-ray scattering systems.
登记范围证据
- ◇Commercial access: Industrial clients commonly submit samples for analyst-run contract work.
- ◇Academic access: External academics can use analytical services or train for hands-on access without a formal proposal review.
- ◇Scope: Methods include microscopy, chemical and elemental imaging/spectroscopy, scattering, depth profiling, nanomechanics and thin-film metrology.
- ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.
本条目依据的证据
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