有公开服务证据
CMRR Materials Characterization Facility
CMRR Materials Characterization Facility at University of California San Diego provides shared-facility access for x-ray and synchrotron characterization, electron microscopy, surface and thin-film characterization, and optical microscopy and spectroscopy. Registration, training, project review, fees, and current instrument availability may apply.
公开提供对外服务
公开描述的能力
Advanced characterization
X-ray and synchrotron characterization
Advanced characterization
Electron microscopy
Advanced characterization
Surface and thin-film characterization
Advanced characterization
Optical microscopy and spectroscopy
Materials testing
Materials characterization
技术清单
技术与设备
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X 射线与中子
X-ray diffractometer
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表面分析
Inventory includes Hitachi UH4150 UV-Vis-NIR, JEOL JSM-7400F FE-SEM, Kobelco photocurrent, Lake Shore 8400 Hall, Panalytical XPert line/point XRD, PHI Quantera XPS, Bruker D2 Phaser, Rigaku SmartLab and Veeco Dimension 3100 AFM/MFM.
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实验室设备
SAXS uses a Xenocs Xeuss 3.0 with GeniX3D sources and a one-megapixel 2D detector.
登记范围证据
- ◇Access: External non-UCSD users may access through an external user service agreement and facility account..
- ◇Capabilities: Characterization of thin-film and powder nanomaterials using XRD, XPS, Hall effect, UV-Vis, AFM/MFM, SEM and photocurrent systems..
- ◇Operations: Equipment access requires account setup, equipment request, training and reservations through Facility Online Manager..
- ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.
本条目依据的证据
这些公开条目由 Vicena 根据所引用的实验室来源整理。被收录不代表存在合作关系，也不代表目前可承接、已有报价或已接受项目。本主页不构成推荐、可用性确认或报价，也不代表存在商业合作关系。