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有公开服务证据

Eyring Materials Center

Eyring Materials Center at Arizona State University provides shared-facility access for electron microscopy, surface and thin-film characterization, optical microscopy and spectroscopy, and materials characterization. Registration, training, project review, fees, and current instrument availability may apply.

公开提供对外服务

4 项服务能力 18 条设备记录 核查于 2026年8月29日

公开描述的能力

Advanced characterization

Electron microscopy

Advanced characterization

Surface and thin-film characterization

Advanced characterization

Optical microscopy and spectroscopy

Materials testing

Materials characterization

了解设备

仪器型号

3 个型号示意图

CAD 示意图展示的是仪器型号。实际安装配置和当前可用性需向实验室确认。

技术清单

技术与设备

5 类设备

  • 显微与成像

    JEOL ARM200F aberration-corrected TEM/STEM

  • 表面分析

    Kratos Axis Supra+ XPS

  • 实验室设备

    Nion UltraSTEM 100 monochromated aberration-corrected STEM

  • 实验室设备

    PerkinElmer Lambda 950 UV-Vis spectrometer

  • 显微与成像

    Thermo Fisher Helios 5 UX dual-beam FIB-SEM

  • 显微与成像

    Thermo Fisher Prisma E SEM

  • 显微与成像

    Thermo Fisher Talos L120C TEM

  • 显微与成像

    Thermo Fisher/FEI Titan Krios cryo-TEM

  • 显微与成像

    WITec Alpha 300 RA+ Raman/AFM

  • 显微与成像

    FEI Titan 80-300 environmental TEM is aberration-corrected and monochromated for in-situ functional-material studies.

  • 显微与成像

    FEI Titan Krios cryo-TEM is dedicated to soft matter and organic/cellular assemblies.

  • X 射线与中子

    JEOL ARM200F aberration-corrected STEM includes X-ray spectroscopy and ultrafast EELS.

  • 表面分析

    Kratos Axis Supra+ XPS provides near-surface elemental composition and chemical-bonding information.

  • X 射线与中子

    Rigaku SmartLab, PANalytical Aeris and STOE STADI P support high-resolution thin-film, powder and transmission XRD.

  • 热学与力学

    Setaram LABSYS EVO performs TGA/DTA/DSC/Cp from room temperature to 1500 C.

  • 实验室设备

    SigRay QuantumLeap H2000 laboratory XAS uses a 300 W molybdenum source and operates from approximately 4.5 keV upward.

  • 显微与成像

    Thermo Fisher Talos F200i operates at 80, 120 and 200 kV with <0.14 nm STEM and <0.10 nm TEM line resolution.

  • 显微与成像

    Witec Alpha 300 RA+ combines 532 nm Raman imaging with AFM/TrueSurface mapping.

登记范围证据

  • ◇Access: Academic and industrial researchers have open access; qualified users can be trained for independent operation..
  • ◇Capabilities: Materials and life-science characterization, surface, optical and structural analysis, high-resolution imaging and defect analysis..
  • ◇Operations: Users schedule instruments and training through iLab after onboarding and required safety training..
  • ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.

本条目依据的证据

Facility-owned shared-access information 核查于 2026年8月26日Facility-owned shared-access information 核查于 2026年8月26日Facility-owned shared-access information 核查于 2026年8月26日Facility-owned shared-access information 核查于 2026年8月26日Eyring Materials Center published instrument information 核查于 2026年8月26日Eyring Materials Center official instrument evidence 核查于 2026年8月29日

这些公开条目由 Vicena 根据所引用的实验室来源整理。被收录不代表存在合作关系，也不代表目前可承接、已有报价或已接受项目。本主页不构成推荐、可用性确认或报价，也不代表存在商业合作关系。