有公开服务证据
Huson Imaging & Characterization Laboratory (HICL)
Huson Imaging & Characterization Laboratory (HICL) at University of Louisville provides shared-facility access for electron microscopy, surface and thin-film characterization, elemental and trace analysis, and analytical chemistry. Registration, training, project review, fees, and current instrument availability may apply.
公开提供对外服务
公开描述的能力
Advanced characterization
Electron microscopy
Advanced characterization
Surface and thin-film characterization
Analytical testing
Elemental and trace analysis
Analytical testing
Analytical chemistry
了解设备
仪器型号
CAD 示意图展示的是仪器型号。实际安装配置和当前可用性需向实验室确认。
型号示意图Transmission electron microscope
Hitachi HT7700
型号示意图Atomic force microscope
Asylum Research MFP-3D-Bio
技术清单
技术与设备
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显微与成像
electron and optical microscopy resources (models not established in reviewed page)
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实验室设备
materials characterization resources (models not established in reviewed page)
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显微与成像
HICL equipment includes a Thermo Fisher Apreo C LoVac FE-SEM with variable pressure, BSE, STEM and EDS; a Hitachi HT7700 TEM; Asylum MFP-3D-Bio and MFP-3D conductive AFMs; and QFI mid-wave thermal imaging.
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微纳加工
Sample preparation includes Ted Pella Au/Au-Pd sputter coating and critical-point drying; contact-angle/goniometry is also listed for the imaging environment.
登记范围证据
- ◇Services: SEM with EDS, STEM and BSD; sputter coating; critical-point drying; AFM; thermal microscopy; goniometry.
- ◇External onboarding: Non-affiliated users can access after agreement, insurance and process review.
- ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.
本条目依据的证据
这些公开条目由 Vicena 根据所引用的实验室来源整理。被收录不代表存在合作关系，也不代表目前可承接、已有报价或已接受项目。本主页不构成推荐、可用性确认或报价，也不代表存在商业合作关系。