有公开服务证据
Materials Characterization Facility
Materials Characterization Facility at Georgia Institute of Technology provides shared-facility access for x-ray and synchrotron characterization, electron microscopy, surface and thin-film characterization, and materials characterization. Registration, training, project review, fees, and current instrument availability may apply.
公开提供对外服务
公开描述的能力
Advanced characterization
X-ray and synchrotron characterization
Advanced characterization
Electron microscopy
Advanced characterization
Surface and thin-film characterization
Materials testing
Materials characterization
技术清单
技术与设备
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X 射线与中子
X-ray diffractometer
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显微与成像
electron microscope
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表面分析
surface analysis instrument
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热学与力学
thermal analyzer
登记范围证据
- ◇External access: Georgia Tech SUMS supports researchers and industry with access, training, reservations and billing..
- ◇Capabilities: SUMS identifies IMS Materials Characterization Facility and searchable characterization equipment..
本条目依据的证据
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