有公开服务证据
Molecular Analysis Facility (MAF)
Molecular Analysis Facility (MAF) at University of Washington provides shared-facility access for surface and thin-film characterization, analytical chemistry, and materials characterization. Registration, training, project review, fees, and current instrument availability may apply.
公开提供对外服务
公开描述的能力
Advanced characterization
Surface and thin-film characterization
Analytical testing
Analytical chemistry
Materials testing
Materials characterization
技术清单
技术与设备
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显微与成像
Asylum Research Cypher AFM
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X 射线与中子
Bruker D8 Discover XRD
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显微与成像
Bruker Dimension Icon AFM
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光谱
Coherent Libra with Ultrafast Helios/EOS transient-absorption system
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显微与成像
FEI Tecnai F20 TEM
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表面分析
IONTOF TOF.SIMS 5
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表面分析
Kratos Axis Supra+ XPS
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显微与成像
Thermo Scientific Apreo 2S SEM
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光谱
Thermo Scientific Nicolet iS50R FTIR
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表面分析
Public rate catalog identifies AFM, Helios FIB/SEM, Apreo SEM, TEM, EBSD/EDS, XRD, XPS, ToF-SIMS, Raman, ellipsometry, QCMD, nanoindentation and kinetic laser spectroscopy.
登记范围证据
- ◇Access: Open-access facility available to UW, other academic institutions, industry and government laboratories..
- ◇Capabilities: Microscopy, spectroscopy and surface-science characterization with wet-lab sample preparation..
- ◇Service: Users may be trained for independent work or have staff perform experiments and consult on experimental design..
- ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.
本条目依据的证据
这些公开条目由 Vicena 根据所引用的实验室来源整理。被收录不代表存在合作关系，也不代表目前可承接、已有报价或已接受项目。本主页不构成推荐、可用性确认或报价，也不代表存在商业合作关系。