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有公开服务证据

Singh Center for Nanotechnology

Singh Center for Nanotechnology at University of Pennsylvania provides shared-facility access for electron microscopy, nanofabrication and microfabrication, surface and thin-film characterization, and materials characterization. Registration, training, project review, fees, and current instrument availability may apply.

公开提供对外服务

4 项服务能力 1 条设备记录 核查于 2026年8月26日

公开描述的能力

Advanced characterization

Electron microscopy

Fabrication

Nanofabrication and microfabrication

Advanced characterization

Surface and thin-film characterization

Materials testing

Materials characterization

技术清单

技术与设备

1 类设备

  • 显微与成像

    shared nanofabrication, electron microscopy and scanning-probe resources operated through three Singh Center facilities

登记范围证据

  • ◇Subfacilities: Includes nanoscale characterization, Quattrone nanofabrication and scanning probe resources.
  • ◇External access: Public fee schedule distinguishes external academic, corporate and government users.

本条目依据的证据

Facility-owned shared-access information 核查于 2026年8月26日Facility-owned shared-access information 核查于 2026年8月26日Facility-owned shared-access information 核查于 2026年8月26日Facility-owned shared-access information 核查于 2026年8月26日Singh Center for Nanotechnology published instrument information 核查于 2026年8月26日

这些公开条目由 Vicena 根据所引用的实验室来源整理。被收录不代表存在合作关系，也不代表目前可承接、已有报价或已接受项目。本主页不构成推荐、可用性确认或报价，也不代表存在商业合作关系。