Vicena 标志 Vicena
← 全部实验室

有公开服务证据

Singh Center for Nanotechnology Nanoscale Characterization Facility

Singh Center for Nanotechnology Nanoscale Characterization Facility at University of Pennsylvania provides shared-facility access for x-ray and synchrotron characterization, electron microscopy, surface and thin-film characterization, and materials characterization. Registration, training, project review, fees, and current instrument availability may apply.

公开提供对外服务

4 项服务能力 9 条设备记录 核查于 2026年8月29日

公开描述的能力

Advanced characterization

X-ray and synchrotron characterization

Advanced characterization

Electron microscopy

Advanced characterization

Surface and thin-film characterization

Materials testing

Materials characterization

了解设备

仪器型号

1 个型号示意图

CAD 示意图展示的是仪器型号。实际安装配置和当前可用性需向实验室确认。

JEOL F200 的 CAD 示意图 型号示意图

Transmission electron microscope

JEOL F200

设备证据

JEOL F200 transmission electron microscope

JEOL F200 200-kV cold-FEG S/TEM has dual EDS, Gatan OneView IS for 30-frame/s in-situ/operando imaging and STEMx capability.

来源 1 ↗来源 2 ↗来源 3 ↗来源 4 ↗来源 5 ↗

技术清单

技术与设备

4 类设备

  • 显微与成像

    JEOL F200 transmission electron microscope

  • 显微与成像

    JEOL NEOARM aberration-corrected scanning transmission electron microscope

  • 显微与成像

    scanning electron microscopy and focused-ion-beam systems listed by NCF

  • 显微与成像

    JEOL F200 200-kV cold-FEG S/TEM has dual EDS, Gatan OneView IS for 30-frame/s in-situ/operando imaging and STEMx capability.

  • 显微与成像

    JEOL NEOARM aberration-corrected S/TEM reaches installed resolution below 0.63 angstrom at 200 kV and includes dual EDS, DualEELS/Gatan Image Filter and K2-IS direct detection.

  • 显微与成像

    SEM suite includes JEOL 7500F HRSEM with 0.8 nm resolution at 30 kV and FEI Quanta 600 FEG ESEM with EDS/EBSD, variable gas, 20-1000 C stages and in-situ manipulation.

  • 表面分析

    TESCAN S8000X combines Xe-plasma FIB, BrightBeam SEM, ToF-SIMS, EDS and cryogenic stage/loadlock to -160 C for milling, chemical analysis and cryo-lift-out.

  • 实验室设备

    Thermo Fisher Krios cryo-EM includes an autoloader, Gatan BioQuantum EELS and K2 Summit detector with cryo-plunge, high-pressure-freezing and cryo-ultramicrotomy support.

  • 微纳加工

    Zeiss ORION NanoFab uses He/Ne ion beams for approximately 0.5-nm-probe imaging and direct writing, with sub-5-nm He patterns and 10-100-nm Ne lithography.

登记范围证据

  • ◇Facility role: Characterization subfacility within the Singh Center.
  • ◇External access: Singh Center fee system includes external academic, corporate and government users.
  • ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.

本条目依据的证据

Facility-owned shared-access information 核查于 2026年8月26日Facility-owned shared-access information 核查于 2026年8月26日Facility-owned shared-access information 核查于 2026年8月26日Singh Center for Nanotechnology Nanoscale Characterization Facility published instrument information 核查于 2026年8月26日Singh Center for Nanotechnology Nanoscale Characterization Facility official instrument evidence 核查于 2026年8月29日

这些公开条目由 Vicena 根据所引用的实验室来源整理。被收录不代表存在合作关系，也不代表目前可承接、已有报价或已接受项目。本主页不构成推荐、可用性确认或报价，也不代表存在商业合作关系。