有公开服务证据
Singh Center for Nanotechnology Scanning Probe Facility
Singh Center for Nanotechnology Scanning Probe Facility at University of Pennsylvania provides shared-facility access for surface and thin-film characterization, and materials characterization. Registration, training, project review, fees, and current instrument availability may apply.
公开提供对外服务
2 项服务能力 2 条设备记录 核查于 2026年8月29日
公开描述的能力
Advanced characterization
Surface and thin-film characterization
Materials testing
Materials characterization
技术清单
技术与设备
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显微与成像
atomic force microscopes and scanning-probe systems listed by the Singh Center
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显微与成像
Published systems include Bruker Icon AFM, Omicron STM-1/RHK SPM 1000 high-vacuum STM, confocal microscopy and local electrical probe equipment.
登记范围证据
- ◇Facility role: Scanning probe subfacility within the Singh Center.
- ◇External access: Parent center publishes external academic, corporate and government rate categories.
- ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.
本条目依据的证据
Facility-owned shared-access information 核查于 2026年8月26日Facility-owned shared-access information 核查于 2026年8月26日Facility-owned shared-access information 核查于 2026年8月26日Singh Center for Nanotechnology Scanning Probe Facility published instrument information 核查于 2026年8月26日Singh Center for Nanotechnology Scanning Probe Facility official instrument evidence 核查于 2026年8月29日
这些公开条目由 Vicena 根据所引用的实验室来源整理。被收录不代表存在合作关系，也不代表目前可承接、已有报价或已接受项目。本主页不构成推荐、可用性确认或报价，也不代表存在商业合作关系。