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有公开服务证据

Stanford Microchemical Analysis Facility

Stanford Microchemical Analysis Facility at Stanford University provides shared-facility access for surface and thin-film characterization, mass spectrometry, elemental and trace analysis, and analytical chemistry. Registration, training, project review, fees, and current instrument availability may apply.

公开提供对外服务

4 项服务能力 6 条设备记录 核查于 2026年8月29日

公开描述的能力

Advanced characterization

Surface and thin-film characterization

Analytical testing

Mass spectrometry

Analytical testing

Elemental and trace analysis

Analytical testing

Analytical chemistry

技术清单

技术与设备

5 类设备
  • 分析仪器

    elemental analysis instrument

  • 质谱

    mass spectrometer

  • 实验室设备

    spectrometer

  • 表面分析

    surface analysis instrument

  • 显微与成像

    JEOL JSM-IT500HR environmental field-emission SEM includes SE/BSE detectors, Oxford Instruments EDS with Aztec software and a Centaurus monochromatic CL detector.

  • 显微与成像

    JEOL JXA-8230 SuperProbe electron microprobe provides five wavelength-dispersive X-ray spectrometers, EDS, electron imaging and xCLENT III hyperspectral cathodoluminescence.

登记范围证据

  • ◇Facility: Official Stanford MAF site presents shared microchemical analytical capabilities and resources..
  • ◇External access: nano@stanford provides a defined external-user pathway for academic, national laboratory, nonprofit and industry users..
  • ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.

本条目依据的证据

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