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有公开服务证据

Texas Materials Institute (TMI)

Texas Materials Institute (TMI) at The University of Texas at Austin provides shared-facility access for x-ray and synchrotron characterization, electron microscopy, surface and thin-film characterization, and polymer analysis. Registration, training, project review, fees, and current instrument availability may apply.

公开提供对外服务

5 项服务能力 12 条设备记录 核查于 2026年8月29日

公开描述的能力

Advanced characterization

X-ray and synchrotron characterization

Advanced characterization

Electron microscopy

Advanced characterization

Surface and thin-film characterization

Materials testing

Polymer analysis

Materials testing

Materials characterization

技术清单

技术与设备

7 类设备
  • X 射线与中子

    X-ray scattering instrument

  • 显微与成像

    electron microscope

  • 实验室设备

    polymer characterization instrument

  • 实验室设备

    spectrometer

  • 表面分析

    surface analysis instrument

  • 热学与力学

    thermal analyzer

  • 实验室设备

    JEOL NEOARM low-kV corrected STEM is assigned to EER 6.644.

  • 光谱

    Mettler TGA/DSC 1 supports polymer thermal analysis; Bruker Invenio R supports FTIR analysis.

  • 微纳加工

    Oxford PlasmaLab 80+ PECVD/etch, March CS170IF RIE and Samco RIE-1C support cleanroom deposition and etching.

  • 实验室设备

    Rigaku MiniFlex 600 systems support phase identification, crystallinity, crystallite size and crystal-structure determination; one has an automated six-position spinner.

  • X 射线与中子

    Rigaku ULTIMA IV and Scintag X1 diffractometers plus SAXSLabs Ganesha are listed in EER 6.640 for XRD/SAXS.

  • 显微与成像

    Thermo Fisher Scios 2 HiVac dual-beam FIB/SEM with electron-beam-lithography capability is assigned to EER 0.756.

登记范围证据

  • ◇External access: TMI offers more than 100 instruments to internal, corporate and external users..
  • ◇Capabilities: TNF describes TMI microscopy and surface characterization including TEM/STEM, TOF-SIMS, XPS, AES and Raman..
  • ◇Capabilities: TMI publishes polymer characterization, spectroscopy and SAXS instrument services with external rates..
  • ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.

本条目依据的证据

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