有公开服务证据
Texas Materials Institute (TMI)
Texas Materials Institute (TMI) at The University of Texas at Austin provides shared-facility access for x-ray and synchrotron characterization, electron microscopy, surface and thin-film characterization, and polymer analysis. Registration, training, project review, fees, and current instrument availability may apply.
公开提供对外服务
公开描述的能力
Advanced characterization
X-ray and synchrotron characterization
Advanced characterization
Electron microscopy
Advanced characterization
Surface and thin-film characterization
Materials testing
Polymer analysis
Materials testing
Materials characterization
了解设备
仪器型号
CAD 示意图展示的是仪器型号。实际安装配置和当前可用性需向实验室确认。
技术清单
技术与设备
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X 射线与中子
X-ray scattering instrument
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显微与成像
electron microscope
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实验室设备
polymer characterization instrument
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实验室设备
spectrometer
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表面分析
surface analysis instrument
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热学与力学
thermal analyzer
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实验室设备
JEOL NEOARM low-kV corrected STEM is assigned to EER 6.644.
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光谱
Mettler TGA/DSC 1 supports polymer thermal analysis; Bruker Invenio R supports FTIR analysis.
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微纳加工
Oxford PlasmaLab 80+ PECVD/etch, March CS170IF RIE and Samco RIE-1C support cleanroom deposition and etching.
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实验室设备
Rigaku MiniFlex 600 systems support phase identification, crystallinity, crystallite size and crystal-structure determination; one has an automated six-position spinner.
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X 射线与中子
Rigaku ULTIMA IV and Scintag X1 diffractometers plus SAXSLabs Ganesha are listed in EER 6.640 for XRD/SAXS.
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显微与成像
Thermo Fisher Scios 2 HiVac dual-beam FIB/SEM with electron-beam-lithography capability is assigned to EER 0.756.
登记范围证据
- ◇External access: TMI offers more than 100 instruments to internal, corporate and external users..
- ◇Capabilities: TNF describes TMI microscopy and surface characterization including TEM/STEM, TOF-SIMS, XPS, AES and Raman..
- ◇Capabilities: TMI publishes polymer characterization, spectroscopy and SAXS instrument services with external rates..
- ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.
本条目依据的证据
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