Public service evidence
Materials Characterization Facility
Materials Characterization Facility at Georgia Institute of Technology provides shared-facility access for x-ray and synchrotron characterization, electron microscopy, surface and thin-film characterization, and materials characterization. Registration, training, project review, fees, and current instrument availability may apply.
External services publicly offered
Publicly described capabilities
Advanced characterization
X-ray and synchrotron characterization
Advanced characterization
Electron microscopy
Advanced characterization
Surface and thin-film characterization
Materials testing
Materials characterization
Technical inventory
Techniques and equipment
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X-ray & neutron
X-ray diffractometer
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Microscopy & imaging
electron microscope
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Surface analysis
surface analysis instrument
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Thermal & mechanical
thermal analyzer
Registry scope evidence
- ◇External access: Georgia Tech SUMS supports researchers and industry with access, training, reservations and billing..
- ◇Capabilities: SUMS identifies IMS Materials Characterization Facility and searchable characterization equipment..
Evidence used for this listing
Vicena compiles these public listings from cited laboratory sources. A listing does not imply a partnership, current availability, pricing, or acceptance of a project. This profile is not an endorsement, availability check, quote, or representation of a commercial relationship.