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Public service evidence

Nanoscale Characterization and Fabrication Lab (NCFL)

Nanoscale Characterization and Fabrication Lab (NCFL) at Virginia Tech provides shared-facility access for x-ray and synchrotron characterization, electron microscopy, nanofabrication and microfabrication, and surface and thin-film characterization. Registration, training, project review, fees, and current instrument availability may apply.

External services publicly offered

4 capabilities 9 equipment records Reviewed 2026-08-29

Publicly described capabilities

Advanced characterization

X-ray and synchrotron characterization

Advanced characterization

Electron microscopy

Fabrication

Nanofabrication and microfabrication

Advanced characterization

Surface and thin-film characterization

Explore the equipment

Instrument models

2 illustrated models

CAD illustrations show the instrument model. Confirm the installed configuration and current availability with the lab.

Technical inventory

Techniques and equipment

3 equipment types

  • Micro/nanofabrication

    cleanroom process equipment

  • Microscopy & imaging

    electron microscope

  • Microscopy & imaging

    focused-ion-beam system

  • Surface analysis

    surface analysis instrument

  • Microscopy & imaging

    Additional official inventory includes JEOL IT-500HR and JSM-IT800 FEG SEMs, FEI Quanta 600 ESEM, JEOL JBX-8100FS EBL, AFM, triboindenter and specimen-preparation systems.

  • Microscopy & imaging

    JEOL JEM 2100 analytical S/TEM provides STEM-EDS mapping to about 5 nm and imaging suited to polymeric and biological samples.

  • Microscopy & imaging

    JEOL JEM ARM200F NEOARM aberration-corrected S/TEM uses a cold FEG at 80/200 kV, reaches 0.07 nm STEM HAADF resolution at 200 kV and carries dual 100 mm2 EDS detectors.

  • Surface analysis

    PHI Quantera Hybrid XPS uses monochromatic Al K-alpha with 9-200 micrometre selectable beam, automated ion-milling depth profiling and a stage heated to 300 C.

  • Microscopy & imaging

    Thermo Scientific Helios 5 UC combines SEM and FIB, with 0.6 nm electron resolution, 2.5 nm ion resolution, 500 V-30 kV operation, EDS/EBSD and 3D reconstruction workflows.

Registry scope evidence

  • ◇Network membership: NCFL is identified as a NanoEarth/NNCI facility..
  • ◇Facility: Virginia Tech identifies NCFL as a shared nanoscale characterization and fabrication laboratory..
  • ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.

Evidence used for this listing

Facility-owned shared-access information Reviewed 2026-08-26Facility-owned shared-access information Reviewed 2026-08-26Nanoscale Characterization and Fabrication Lab (NCFL) official instrument evidence Reviewed 2026-08-29Nanoscale Characterization and Fabrication Lab (NCFL) official instrument evidence Reviewed 2026-08-29Nanoscale Characterization and Fabrication Lab (NCFL) official instrument evidence Reviewed 2026-08-29Nanoscale Characterization and Fabrication Lab (NCFL) official instrument evidence Reviewed 2026-08-29Nanoscale Characterization and Fabrication Lab (NCFL) official instrument evidence Reviewed 2026-08-29

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