Public service evidence
Singh Center for Nanotechnology Scanning Probe Facility
Singh Center for Nanotechnology Scanning Probe Facility at University of Pennsylvania provides shared-facility access for surface and thin-film characterization, and materials characterization. Registration, training, project review, fees, and current instrument availability may apply.
External services publicly offered
Publicly described capabilities
Advanced characterization
Surface and thin-film characterization
Materials testing
Materials characterization
Technical inventory
Techniques and equipment
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Microscopy & imaging
atomic force microscopes and scanning-probe systems listed by the Singh Center
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Microscopy & imaging
Published systems include Bruker Icon AFM, Omicron STM-1/RHK SPM 1000 high-vacuum STM, confocal microscopy and local electrical probe equipment.
Registry scope evidence
- ◇Facility role: Scanning probe subfacility within the Singh Center.
- ◇External access: Parent center publishes external academic, corporate and government rate categories.
- ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.
Evidence used for this listing
Vicena compiles these public listings from cited laboratory sources. A listing does not imply a partnership, current availability, pricing, or acceptance of a project. This profile is not an endorsement, availability check, quote, or representation of a commercial relationship.