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Public service evidence

Texas Materials Institute (TMI)

Texas Materials Institute (TMI) at The University of Texas at Austin provides shared-facility access for x-ray and synchrotron characterization, electron microscopy, surface and thin-film characterization, and polymer analysis. Registration, training, project review, fees, and current instrument availability may apply.

External services publicly offered

5 capabilities 12 equipment records Reviewed 2026-08-29

Publicly described capabilities

Advanced characterization

X-ray and synchrotron characterization

Advanced characterization

Electron microscopy

Advanced characterization

Surface and thin-film characterization

Materials testing

Polymer analysis

Materials testing

Materials characterization

Explore the equipment

Instrument models

1 illustrated model

CAD illustrations show the instrument model. Confirm the installed configuration and current availability with the lab.

Technical inventory

Techniques and equipment

7 equipment types

  • X-ray & neutron

    X-ray scattering instrument

  • Microscopy & imaging

    electron microscope

  • Laboratory equipment

    polymer characterization instrument

  • Laboratory equipment

    spectrometer

  • Surface analysis

    surface analysis instrument

  • Thermal & mechanical

    thermal analyzer

  • Laboratory equipment

    JEOL NEOARM low-kV corrected STEM is assigned to EER 6.644.

  • Spectroscopy

    Mettler TGA/DSC 1 supports polymer thermal analysis; Bruker Invenio R supports FTIR analysis.

  • Micro/nanofabrication

    Oxford PlasmaLab 80+ PECVD/etch, March CS170IF RIE and Samco RIE-1C support cleanroom deposition and etching.

  • Laboratory equipment

    Rigaku MiniFlex 600 systems support phase identification, crystallinity, crystallite size and crystal-structure determination; one has an automated six-position spinner.

  • X-ray & neutron

    Rigaku ULTIMA IV and Scintag X1 diffractometers plus SAXSLabs Ganesha are listed in EER 6.640 for XRD/SAXS.

  • Microscopy & imaging

    Thermo Fisher Scios 2 HiVac dual-beam FIB/SEM with electron-beam-lithography capability is assigned to EER 0.756.

Registry scope evidence

  • ◇External access: TMI offers more than 100 instruments to internal, corporate and external users..
  • ◇Capabilities: TNF describes TMI microscopy and surface characterization including TEM/STEM, TOF-SIMS, XPS, AES and Raman..
  • ◇Capabilities: TMI publishes polymer characterization, spectroscopy and SAXS instrument services with external rates..
  • ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.

Evidence used for this listing

Facility-owned shared-access information Reviewed 2026-08-26Facility-owned shared-access information Reviewed 2026-08-26Facility-owned shared-access information Reviewed 2026-08-26Facility-owned shared-access information Reviewed 2026-08-26Facility-owned shared-access information Reviewed 2026-08-26Texas Materials Institute (TMI) official instrument evidence Reviewed 2026-08-29Texas Materials Institute (TMI) official instrument evidence Reviewed 2026-08-29

Vicena compiles these public listings from cited laboratory sources. A listing does not imply a partnership, current availability, pricing, or acceptance of a project. This profile is not an endorsement, availability check, quote, or representation of a commercial relationship.